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Investigations into the robustness of the peak turn-on cu... | ResearchHub
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Investigations into the robustness of the peak turn-on current slope method for junction temperature sensing in p-GaN HEMTs
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Authors
Weihao Lu
•
Sheng Li
9 more
•
Weifeng Sun
Published
August 27, 2024
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Journal
Semiconductor Science and Technology
Topics
Materials Science
Biochemistry
Physics
Materials Science
Chemistry
Engineering
Biochemistry
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DOI
10.1088/1361-6641/ad68a0
