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<title>Laterally modulated excitation microscopy: i... | ResearchHub
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<title>Laterally modulated excitation microscopy: improvement of resolution by using a diffraction grating</title>
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Authors
Rainer Heintzmann
•
Christoph Cremer
Published
January 19, 1999
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Journal
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
Topics
Computer Science
Materials Science
Physics
Artificial Intelligence
Quantum Mechanics
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DOI
10.1117/12.336833