Research of AFM Image Matching Based on Wavelet Transform SIFT Algorithm

Supporters

Support the authors with ResearchCoin

Tip RSC

Journal

2022 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)

Topics

Computer Science

Artificial Intelligence

Mathematics

Computer Vision

Statistics

Show all topics

DOI

10.1109/3m-nano61605.2024.10769650